AUTEUR: Ze Zhang
TAILLE DU FICHIER: 7,94 MB
NOM DE FICHIER: Progress in transmission electron microscopy. - Volume 2, Applications in materials science.pdf
ISBN: 9783540676812
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
AUTEUR: Ze Zhang
TAILLE DU FICHIER: 5,33 MB
NOM DE FICHIER: Progress in transmission electron microscopy. - Volume 2, Applications in materials science.pdf
ISBN: 9783540676812
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel e
Buy Progress in Transmission Electron Microscopy: Applications in Material Science v. 2 (Springer Series in Surface Sciences) 2001 by Zhang, Xiao-Feng, Zhang, Ze (ISBN: 9783540676812) from Amazon's Book Store. Everyday low prices and free delivery on eligible orders.